First, the definition of probe
The probe, English Test probe, is the contact medium of electrical testing, for high-end precision electronic hardware components. Probes include test probes, semiconductor probes, ICT probes, high-frequency probes, high-current probes, battery contact probes, etc.
Second, the classification of probes
Probe classification Probes can be divided into according to the use of electronic testing:
A. Optical circuit board test probe: circuit board test and only open circuit and short circuit detection probe before installing components, most of the domestic probe products can replace imported products;
B. Online test probe: detection probe after PCB circuit board installation components; The core technology of high-end products is still in the hands of foreign companies, and some domestic probe products have been successfully developed and can replace imported probe products;
C. Microelectronics test probe: that is, wafer test or chip IC detection probe, the core technology is still in the hands of foreign companies, domestic manufacturers actively participate in research and development, but only a small part of successful production. Main types of probes: cantilever probes and vertical probes.
Cantilever probes: Blade type and epoxy type Vertical probe: Vertical type
1. ICT series probes are generally between 2.54mm-1.27mm in diameter, there are industry standards called 100mil, 75mil, 50mil, and more special diameter is only 0.19mm, mainly used for online circuit testing and functional testing. Also known as ICT test and FCT test. It is also a probe with more applications.
2. Interface probes Non-standard probes, generally customized for a small number of customers who do large test machines, such as Teradyne and Agilent.
3. MicroSeries Probes The center distance between the two test points is generally 0.25mm to 0.76mm.
4. Switch probes A single probe has two currents.
5. High frequency probes (Coaxial Probes) are used to test high frequency signals, with shielding ring can test within 10GHz and 500MHz without shielding ring.
6. Rotary probes (Rotator Probes) The elasticity is generally not high, because its penetration is already very strong, and it is generally used for OSP-treated PCBA testing.
7. High Current Probes The probe diameter is between 2.54mm-4.75mm.Z large test current can reach 39amps.
8. Semiconductor probes are generally between 0.50mm-1.27mm, bandwidth greater than 10GHz, 50Ω characteristic
9.Battery and Connector Contacts are generally used to optimize the contact effect, good stability and long life.
10. Automotive wiring harness test probe Specializing in automotive wiring harness on-off detection, diameter between 1.0--3.5mm, current in 3----50A In addition to the above types, there are temperature probes, Kelvin probes, etc., which are relatively rarely used.
